PI - network Measurement

New State of the Art Features
 Multi-Tasking operation in Microsoft Windows allows testing in background while generating reports and graphs
by operator
 Test limits such as Temperature range and ppm can be changed after actual testing, this gives better reports and
graphs presentation for customers
 Support both “Direct impedance measure” & “Phy. CL “ for FL measurement (Optional Phy CL head)
 User Programmable Drive Level : 10nW - 1mW ( max and min power depends on Rr of crystal )
 Crystal Measurement through passive  network techniques with KH1800 / KH1820 network analyser
 Multiple crystal types may be accommodated in the same temperature run
 Automatic C0 cancellation for high frequencies
 User friendly system operation including menu driven, mouse operation and easy system calibration
 Perform pass/fail testing to user specified limits
 Stacked dual row test wheels can hold up to 508 crystals per chamber ( depends on crystal type )
 Measures : Fs, FL, Rs, CL, C0, C1, L1, Q, Ts, C0/C1, DF, DLD, Spurious scan, Fs/T, and FL/T
 Optional Chinese operating software
 Frequency Range : KH1120 or KH1800 (option) : 1 - 120 MHz
KH1240 or KH1820 (option): 1 - 240 MHz
Standard System Configuration
 KH1120 or KH1240 (option KH1800 or KH820) Crystal  Network Analyser
 KH7700 System Operating Software & System Cabling
 KM5901 Switch Box
 Work table

 KH7220 Chamber (Option: KH7600 Chamber)
 Dual Row  network test head and 4 inch cover (Optional : Stacked Dual Row  Network Test Head and 8" cover)
 Dual row test wheel
 Industrial computer or Lenovo Computer (or compatible) with Windows XP
System Options
 Dual Chamber, Multi-Task, Time sharing Testing
 Chinese Language Support
 Laser printer
Software Capabilities
Easy Test Set up and Operation
 The user friendly Windows environment eliminates the need of remembering how to operate or program a
test.
Other Standard Reports
 Printout of Crystal Failures
 Printout of Crystal Measurements
 Printout of Frequency and Resistance vs. Temperature
 Plot of Frequency and Resistance vs. Temperature
 Tabular Printout of the Curve-fit Data
 Data Transfer to other standard applications, such as dBase, Lotus etc. for further analysis